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Withdrawn | Published: 10/10/1997
ASTM E986-97 Withdrawn
Standard Practice for Scanning Electron Microscope Beam Size Characterization
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM E986-97
Publication date: 10/10/1997
Pages: 3
Note: Withdrawn
Country: American technical standard
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You can buy at www.mystandards.bizAnotation
Keywords:edge sharpness, electron beam size, E 766, graphite fiber, magnification, NIST-SRM 2069B, performance, SEM, specimen interaction, waveform, ICS Number Code 31.120 (Electronic display devices), 37.020 (Optical equipment)
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