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Withdrawn | Published: 10/12/2002
ASTM F1188-02 Withdrawn
Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline (Withdrawn 2003)
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM F1188-02
Publication date: 10/12/2002
Pages: 9
Note: Withdrawn
Country: American technical standard
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You can buy at www.mystandards.bizAnotation
Keywords:infrared absorption, infrared spectrophotometry, interstitial oxygen, oxygen, silicon, ICS Number Code 29.045 (Semiconducting materials)
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