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Withdrawn | Published: 01/01/1996
ASTM F1259M-96 Withdrawn
Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric]
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM F1259M-96
Publication date: 01/01/1996
Pages: 2
Note: Withdrawn
Country: American technical standard
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You can buy at www.mystandards.bizAnotation
Keywords:design guideline, electromigration, electromigration failure, interconnect metallization, metallization open circuit, metallization resistance, microelectronic, test structure, ICS Number Code 17.220.20 (Measurement of electrical and magnetic quantities), 31.200 (Integrated circuits. Microelectronics)
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