Withdrawn | Published: 01/01/1996

ASTM F1260M-96 Withdrawn

Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]

Available languages: English

Available design: Online Secure PDF

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Detail information

Designation: ASTM F1260M-96

Publication date: 01/01/1996

Pages: 8

Note: Withdrawn

Country: American technical standard

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Keywords:
electromigration, electromigration metallization, integrated circuit, microelectronics, open circuit, resistance increase, time-to-failure, ICS Number Code 17.220.20 (Measurement of electrical and magnetic quantities), 31.200 (Integrated circuits. Microelectronics)

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