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Active standard | Published: 01/06/2025
ASTM F1467-25
Standard Guide for Use of an X-Ray Tester (?10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Available languages: English
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Detail information
Designation: ASTM F1467-25
Publication date: 01/06/2025
Pages: 18
Country: American technical standard
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You can buy at www.mystandards.bizAnotation
Keywords:ionizing radiation effects, microcircuits, radiation hardness, semiconductor devices, X-ray testing,, ICS Number Code 31.020 (Electronic components in general)
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