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Active standard | Published: 01/01/2024
ASTM F980-16(2024)
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Available languages: English
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Detail information
Designation: ASTM F980-16(2024)
Publication date: 01/01/2024
Pages: 7
Country: American technical standard
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Keywords:annealing factor, annealing function, displacement damage, integrated circuits, neutron damage, neutron degradation, photoconducting device, rapid annealing, semiconductor devices,, ICS Number Code 29.045 (Semiconducting materials)
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