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Withdrawn | Published: 30/08/1985
BS CECC 00013:1985 Withdrawn
Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice.
Available languages: English
Available design: PDF - Immediate download, Print design
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Detail information
Designation: BS CECC 00013:1985
Publication date: 30/08/1985
Pages: 24
Note: Withdrawn
Country: British technical standard
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