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Active standard | Published: 22/07/2020
BS IEC 62047-27:2017
Semiconductor devices. Micro-electromechanical devices. Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT).
Available languages: English
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Detail information
Designation: BS IEC 62047-27:2017
Publication date: 22/07/2020
Pages: 20
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 89909 6 Status: DefinitivePopular Publishers
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