Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Active standard | Published: 20/04/2021
BS IEC 62047-35:2019
Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics under bending deformation for flexible electromechanical devices.
Available languages: English
Available design: PDF - Immediate download, Print design
from 299.60 USD
show on eshop
Detail information
Designation: BS IEC 62047-35:2019
Publication date: 20/04/2021
Pages: 24
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 580 99495 1 Status: DefinitivePopular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
