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Active standard | Published: 22/03/2024
BS IEC 62047-43:2024
Semiconductor devices. Micro-electromechanical devices. Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices.
Available languages: English
Available design: PDF - Immediate download, Print design
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Detail information
Designation: BS IEC 62047-43:2024
Publication date: 22/03/2024
Pages: 22
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 17665 0 Status: DefinitivePopular Publishers
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