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Active standard | Published: 07/09/2022
BS IEC 63068-4:2022
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence.
Available languages: English
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Detail information
Designation: BS IEC 63068-4:2022
Publication date: 07/09/2022
Pages: 28
Country: British technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
ISBN: 978 0 539 18417 4 Status: DefinitivePopular Publishers
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