Active standard | Published: 10/03/2000

IEC/TS 61945-ed.1.0

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
(Circuits integres - Agrement d´une ligne de fabrication - Methodologie d´analyse technologique et de defaillance)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 51.90 EUR show on eshop

Detail information

Designation: IEC/TS 61945-ed.1.0

Publication date: 10/03/2000

Pages: 23

Country: International technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis. Decrit la methodologie danalyse technologique et de defaillance au cours de la fabrication des circuits integres. Lanalyse technologique a pour but de determiner la constitution dun composant par des observations utilisant des moyens dont le pouvoir de resolution est progressif avec le degre danalyse. considere.

Popular Publishers

full catalog