Active standard | Published: 29/09/2000

IEC 60191-6-3-ed.1.0

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)
(Normalisation mecanique des dispositifs a semiconducteurs - Partie 6-3: Regles generales pour la preparation des dessins d´encombrement des dispositifs a semiconducteurs a montage en surface - Methodes de mesure pour les boitiers plats quadrangulaires (QFP))

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Detail information

Designation: IEC 60191-6-3-ed.1.0

Publication date: 29/09/2000

Pages: 34

Country: International technical standard

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Anotation

IEC 60191-6-3:2000 stipulates a method for quad flat packs (QFP) measuring dimensions which are classified into Form E. La CEI 60191-6-3:2000 stipule une methode de mesure des dimensions des boitiers plats quadrangulaires (QFP) qui sont classes dans la forme E.

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