Active standard | Published: 30/08/2002

IEC 60749-8-ed.1.0

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 8: Etancheite)

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Detail information

Designation: IEC 60749-8-ed.1.0

Publication date: 30/08/2002

Pages: 31

Country: International technical standard

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Anotation

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispo-sitifs discrets et circuits integres), determine le taux de fuite des dispositifs a semiconducteurs. Le contenu des corrigenda davril 2003 et daout 2003 a ete pris en consideration dans cet exemplaire.

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