Active standard | Published: 01/01/1983

IEC 60759-ed.1.0

Standard test procedures for semiconductor X-ray energy spectrometers
(Methodes d´essais normalises des spectrometres d´energie X a semicteur)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

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Detail information

Designation: IEC 60759-ed.1.0

Publication date: 01/01/1983

Pages: 97

Country: International technical standard

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Anotation

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer. Donne les methodes dessais normalises des spectrometres denergie X a semicteur constitues dun semicteur et de lelectronique de traitement du signal lies par une interface a un analyseur damplitude couple a un calculateur.

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