Active standard | Published: 26/04/2010

IEC 62416-ed.1.0

Semiconductor devices - Hot carrier test on MOS transistors
(Dispositifs a semiconducteurs - Essai de porteur chaud sur les transistors MOS)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

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Detail information

Designation: IEC 62416-ed.1.0

Publication date: 26/04/2010

Pages: 20

Country: International technical standard

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Anotation

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime. La CEI 62416:2010 decrit lessai de porteur chaud au niveau de la plaquette sur les transistors NMOS et PMOS. Cet essai est destine a determiner si les transistors individuels sont conformes a la duree de vie exigee du porteur chaud dans un processus (C)MOS donne.

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