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Withdrawn | Published: 01/08/2013
IEEE 1505.1-2008 Withdrawn
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Available languages: English
Available design: electronic (protected pdf) - Immediate download
from 188.00 USD
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Detail information
Designation: IEEE 1505.1-2008
Publication date: 01/08/2013
Pages: 0
Note: Withdrawn
Country: International technical standard
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