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Withdrawn | Published: 05/12/2008
IEEE 1620-2008 Withdrawn
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Available languages: English
Available design: electronic (protected pdf) - Immediate download
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Detail information
Designation: IEEE 1620-2008
Publication date: 05/12/2008
Pages: 0
Note: Withdrawn
Country: International technical standard
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