Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Active standard | Published: 01/04/2022
ISO/TS 22933:2022
Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
(Analyse chimique des surfaces — Spectrométrie de masse des ions secondaires — Méthode pour le mesurage de la résolution en masse dans la SIMS)
Available languages: English
Available design: electronic design (pdf), Print design
from 147.80 USD
show on eshop
Detail information
Designation: ISO/TS 22933:2022
Publication date: 01/04/2022
Pages: 15
Country: International technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Description / Abstract: This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes.Popular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
