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Active standard | Published: 26/05/2025
ISO 17297:2025
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
(Analyse par microfaisceaux — Application de faisceaux d´ions focalisés pour la préparation d´éprouvettes de MET — Vocabulaire)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: ISO 17297:2025
Publication date: 26/05/2025
Pages: 14
Country: International technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Description / Abstract: This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).Popular Publishers
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