Active standard | Published: 13/07/2022

ISO 23729:2022

Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
(Analyse chimique des surfaces — Microscopie a force atomique — Lignes directrices relatives au mode opératoire de restauration des images de microscopie a force atomique dilatées par la taille finie de la sonde)

Available languages: English

Available design: electronic design (pdf), Print design

from 148.20 USD show on eshop

Detail information

Designation: ISO 23729:2022

Publication date: 13/07/2022

Pages: 15

Country: International technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

Description / Abstract: This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

Popular Publishers

full catalog