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Active standard | Published: 20/10/2017
JIS C5630-26:2017
Semiconductor devices -- Micro-electromechanical devices -- Part 26: Description and measurement methods for micro trench and needle structures
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 87 498.00 CZK
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Detail information
Designation: JIS C5630-26:2017
Publication date: 20/10/2017
Pages: 24
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