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Active standard | Published: 20/03/2009
JIS C5630-3:2009
Semiconductor devices -- Micro-electromechanical devices-- Part 3: Thin film standard test piece for tensile testing
Available languages: Japanese
Available design: electronic design (pdf), Print design
from 43 749.00 CZK
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Detail information
Designation: JIS C5630-3:2009
Publication date: 20/03/2009
Pages: 6
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