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Active standard | Published: 01/09/2010
UNE-EN 60191-6-19:2010
Mechanical standardization of semiconductor devices -- Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage (Endorsed by AENOR in September of 2010.)
Available languages: English
Available design: electronic design (pdf), Print design
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Detail information
Designation: UNE-EN 60191-6-19:2010
Publication date: 01/09/2010
Pages: 17
Country: Spanish technical standard
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