STN - Slovenské národní normy

Transistors. Measuring method of collector-base and emitter-base breakdown voltage

Dostupné prevedenie: Tlačené

Transistors. Measuring method of common-emitter small-signal short- circuit forward current transfer ratio

Dostupné prevedenie: Tlačené

Transistors. Method of noise figure measuring

Dostupné prevedenie: Tlačené

Transistors. Methods of measuring collector cut-off current, emitter cut-off current and collector-emitter cut-off current

Dostupné prevedenie: Tlačené

Transistors. Methods of measuring collector and emitter barrier layer capacitance

Dostupné prevedenie: Tlačené

Transistors. Measuring method of static value of the common-emitter forward current transfer ratio

Dostupné prevedenie: Tlačené

Transistors. Measuring method of absolute value of forward current transfer ratio and transition frequency

Dostupné prevedenie: Tlačené

Transistors. Measuring methods of base-emitter voltage

Dostupné prevedenie: Tlačené

Transistors. Methods for measurement of thermal resistance

Dostupné prevedenie: Tlačené

Transistors. Methods for measurement of output capacity in common base connection

Dostupné prevedenie: Tlačené