Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Stránka 2985
Mechanical Standardization Of Semiconductor Devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silicon Fine-pitch Land Grid Array (S-FBGA and S-FLGA)
Dostupné jazyky: Anglicky
Dostupné prevedenie: Tlačené
Analogue integrated circuits. Measuring methods of electrical parameters
Dostupné prevedenie: Tlačené
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Dostupné prevedenie: Tlačené
Mechanical standardization of semiconductor devices. Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
Dostupné prevedenie: Tlačené
Mechanical standardization of semiconductor devices Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Dostupné prevedenie: Tlačené
Mechanical standardization of semiconductor devices -- Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA) - Rectangular type
Dostupné prevedenie: Tlačené
Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array and Fine-pitch Land Grid Array (FBGA/FLGA)
Dostupné prevedenie: Tlačené
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
Dostupné jazyky: Anglicky
Dostupné prevedenie: Tlačené
Semiconductor devices - Micro-electromechanical devices Part 2: Tensile testing method of thin film materials
Dostupné jazyky: Anglicky
Dostupné prevedenie: Tlačené
Semiconductor devices - Micro-electromechanical devices Part 3: Thin film standard test piece for tensile testing
Dostupné jazyky: Anglicky
Dostupné prevedenie: Tlačené