STN - Slovenské národní normy

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

Dostupné jazyky: Anglicky

Dostupné prevedenie: Tlačené

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Dostupné jazyky: Anglicky

Dostupné prevedenie: Tlačené

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Dostupné jazyky: Anglicky

Dostupné prevedenie: Tlačené

Semiconductor devices. Mechanical and climatic test methods

Dostupné prevedenie: Tlačené

Semiconductor devices - Mechanical and climatic test methods -- Part 3: External visual examination

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Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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Semiconductor devices - Mechanical and climatic test methods -- Part 5: Steady-state temperature humidity bias life test

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Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature

Dostupné prevedenie: Tlačené

8emiconductor devices - Mechanical and climatic test methods -- Part 7: Internal moisture content measurement and the analysis of other residual gases

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Semiconductor devices - Mechanical and climatic test methods -- Part 9: Permanence of marking

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