ASTM F1259-89 Neplatná

Podrobné informace

Označení: ASTM F1259-89

Datum vydání: 01.01.1989

Stran: 2

Poznámka: Neplatná

Země: Americká technická norma

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Můžete zakoupit na eshop.normservis.cz

Anotace

Keywords:
Accelerated aging/testing-semiconductors, Defects-semiconductors, Electrical conductors-semiconductors, Electromigration, Failure end point-electronic components/devices, Metallization, Microelectronic device processing, Resistance-failure, Silicon-semiconductor applications, Straight-line testing, Test structures, Time to failure, Voltage, design of flat straight-line test structures (for detecting, metallization open-circuit/resistance to increase failure due to, electromigration), guide