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BS - British national standards
Page 3672
BS EN IEC 60749-12:2018 (18/04/2018)
Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency.
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.80 USD more info
BS EN IEC 60749-13:2018 (30/04/2018)
Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.90 USD more info
BS EN 60749-14:2003 (15/12/2003)
Semiconductor devices. Mechanical and climatic test methods. Robustness of terminations (lead integrity).
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.90 USD more info
BS EN IEC 60749-15:2020 (01/10/2020)
Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices.
Available languages: English
Available design: PDF - Immediate download, Print design
from 214.90 USD more info
BS EN 60749-16:2003 (24/06/2004)
Semiconductor devices. Mechanical and climatic test methods. Particle impact noise detection (PIND).
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.80 USD more info
BS EN IEC 60749-17:2019 (15/05/2019)
Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation.
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.80 USD more info
BS EN IEC 60749-17:2019-TC (24/02/2020)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation.
Available languages: English
Available design: electronic design (pdf), Print design
from 259.00 USD more info
BS EN IEC 60749-18:2019 (10/06/2019)
Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose).
Available languages: English
Available design: PDF - Immediate download, Print design
from 300.40 USD more info
BS EN IEC 60749-18:2019-TC (03/11/2020)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Ionizing radiation (total dose).
Available languages: English
Available design: PDF - Immediate download, Print design
from 422.10 USD more info
BS EN 60749-19:2003+A1:2010 (31/10/2010)
Semiconductor devices. Mechanical and climatic test methods. Die shear strength.
Available languages: English
Available design: PDF - Immediate download, Print design
from 183.80 USD more info
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