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BS - British national standards
Page 3673
BS EN 60749-2:2002 (24/09/2002)
Semiconductor devices. Mechanical and climatic test methods. Low air pressure.
Available languages: English
Available design: PDF - Immediate download, Print design
from 163.90 EUR more info
BS EN 60749-20-1:2009 (31/07/2009)
Semiconductor devices. Mechanical and climatic test methods. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat.
Available languages: English
Available design: PDF - Immediate download, Print design
from 313.90 EUR more info
BS EN IEC 60749-20-1:2026 (09/03/2026)
Semiconductor devices ? Mechanical and climatic test methods. Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat.
Available languages: English
Available design: PDF - Immediate download, Print design
from 313.90 EUR more info
BS EN IEC 60749-20-1:2026-TC (20/03/2026)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat.
Available languages: English
Available design: PDF - Immediate download, Print design
from 440.90 EUR more info
BS EN IEC 60749-20:2020 (14/10/2020)
Semiconductor devices. Mechanical and climatic test methods. Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat.
Available languages: English
Available design: PDF - Immediate download, Print design
from 267.70 EUR more info
BS EN 60749-21:2011 (31/08/2011)
Semiconductor devices. Mechanical and climatic test methods. Solderability.
Available languages: English
Available design: PDF - Immediate download, Print design
from 267.70 EUR more info
BS EN IEC 60749-21:2026 (04/02/2026)
Semiconductor devices. Mechanical and climatic test methods. Solderability.
Available languages: English
Available design: PDF - Immediate download, Print design
from 267.70 EUR more info
BS EN IEC 60749-21:2026-TC (12/02/2026)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Solderability.
Available languages: English
Available design: PDF - Immediate download, Print design
from 376.30 EUR more info
BS EN IEC 60749-22-1:2026 (21/01/2026)
Semiconductor devices — Mechanical and climatic test methods. Bond strength — wire bond pull test methods.
Available languages: English
Available design: PDF - Immediate download, Print design
from 371.60 EUR more info
BS EN IEC 60749-22-2:2026 (21/01/2026)
Semiconductor devices — Mechanical and climatic test methods. Bond strength — Wire bond shear test methods.
Available languages: English
Available design: PDF - Immediate download, Print design
from 313.90 EUR more info
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