BS - British national standards

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BS EN 60749-4:2017 (28.11.2017)

BS EN 60749-4:2017 (28/11/2017)

Semiconductor devices. Mechanical and climatic test methods. Damp heat, steady state, highly accelerated stress test (HAST).

Available languages: English

Available design: PDF - Immediate download, Print design

from 191.60 EUR more info
BS EN 60749-40:2011 (30.9.2011)

BS EN 60749-40:2011 (30/09/2011)

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using a strain gauge.

Available languages: English

Available design: PDF - Immediate download, Print design

from 267.70 EUR more info
BS EN IEC 60749-41:2020 (9.9.2020)

BS EN IEC 60749-41:2020 (09/09/2020)

Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices.

Available languages: English

Available design: PDF - Immediate download, Print design

from 267.70 EUR more info
BS EN 60749-42:2014 (31.10.2014)

BS EN 60749-42:2014 (31/10/2014)

Semiconductor devices. Mechanical and climatic test methods. Temperature and humidity storage.

Available languages: English

Available design: PDF - Immediate download, Print design

from 163.90 EUR more info
BS EN 60749-44:2016 (30.11.2016)

BS EN 60749-44:2016 (30/11/2016)

Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.

Available languages: English

Available design: PDF - Immediate download, Print design

from 267.70 EUR more info
BS EN IEC 60749-5:2024 (6.2.2024)

BS EN IEC 60749-5:2024 (06/02/2024)

Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test.

Available languages: English

Available design: PDF - Immediate download, Print design

from 191.60 EUR more info
BS EN IEC 60749-5:2024-TC (9.2.2024)

BS EN IEC 60749-5:2024-TC (09/02/2024)

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test.

Available languages: English

Available design: PDF - Immediate download, Print design

from 270.10 EUR more info
BS EN 60749-6:2017 (24.11.2017)

BS EN 60749-6:2017 (24/11/2017)

Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature.

Available languages: English

Available design: PDF - Immediate download, Print design

from 163.90 EUR more info
BS EN 60749-7:2011 (30.9.2011)

BS EN 60749-7:2011 (30/09/2011)

Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases.

Available languages: English

Available design: PDF - Immediate download, Print design

from 191.60 EUR more info
BS EN IEC 60749-7:2026 (21.1.2026)

BS EN IEC 60749-7:2026 (21/01/2026)

Semiconductor devices. Mechanical and climatic test methods. Internal moisture content measurement and the analysis of other residual gases.

Available languages: English

Available design: PDF - Immediate download, Print design

from 191.60 EUR more info
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