BS - British national standards

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BS EN 60749-33:2004 (22.6.2004)

BS EN 60749-33:2004 (22/06/2004)

Semiconductor devices. Mechanical and climatic test methods. Accelerated moisture resistance. Unbiased autoclave.

Available languages: English

Available design: PDF - Immediate download, Print design

from 163.90 EUR more info
BS EN IEC 60749-34-1:2025 (18.8.2025)

BS EN IEC 60749-34-1:2025 (18/08/2025)

Semiconductor devices. Mechanical and climatic test methods. Power cycling test for power semiconductor module.

Available languages: English

Available design: PDF - Immediate download, Print design

from 313.90 EUR more info
BS EN 60749-34:2010 (28.2.2011)

BS EN 60749-34:2010 (28/02/2011)

Semiconductor devices. Mechanical and climatic test methods. Power cycling.

Available languages: English

Available design: PDF - Immediate download, Print design

from 163.90 EUR more info
BS EN 60749-35:2006 (30.11.2006)

BS EN 60749-35:2006 (30/11/2006)

Semiconductor devices. Mechanical and climatic test methods. Acoustic microscopy for plastic encapsulated electronic components.

Available languages: English

Available design: PDF - Immediate download, Print design

from 267.70 EUR more info
BS EN 60749-36:2003 (19.6.2003)

BS EN 60749-36:2003 (19/06/2003)

Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state.

Available languages: English

Available design: PDF - Immediate download, Print design

from 163.90 EUR more info
BS EN IEC 60749-37:2022 (22.11.2022)

BS EN IEC 60749-37:2022 (22/11/2022)

Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer.

Available languages: English

Available design: PDF - Immediate download, Print design

from 267.70 EUR more info
BS EN IEC 60749-37:2022-TC (20.12.2022)

BS EN IEC 60749-37:2022-TC (20/12/2022)

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Board level drop test method using an accelerometer.

Available languages: English

Available design: PDF - Immediate download, Print design

from 376.30 EUR more info
BS EN 60749-38:2008 (30.6.2008)

BS EN 60749-38:2008 (30/06/2008)

Semiconductor devices. Mechanical and climatic test methods. Soft error test method for semiconductor devices with memory.

Available languages: English

Available design: PDF - Immediate download, Print design

from 191.60 EUR more info
BS EN IEC 60749-39:2022 (7.3.2022)

BS EN IEC 60749-39:2022 (07/03/2022)

Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components.

Available languages: English

Available design: PDF - Immediate download, Print design

from 191.60 EUR more info
BS EN IEC 60749-39:2022-TC (17.3.2022)

BS EN IEC 60749-39:2022-TC (17/03/2022)

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components.

Available languages: English

Available design: PDF - Immediate download, Print design

from 270.10 EUR more info
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