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ČSN - Czech national standards
Page 3356
ČSN EN 62417 (01/12/2010)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010)
Available languages: English
Available design: Print design
from 10.70 USD more info
ČSN EN 62416 (01/12/2010)
Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
Available languages: English
Available design: Print design
from 10.70 USD more info
ČSN EN 62415 (01/12/2010)
Semiconductor devices - Constant current electromigration test (IEC 62415:2010)
Available languages: English
Available design: Print design
from 10.70 USD more info
ČSN EN 62418 (01/01/2011)
Semiconductor devices - Metallization stress void test (IEC 62418:2010)
Available languages: English
Available design: Print design
from 20.90 USD more info
ČSN EN 62047-1-ed.2 (01/09/2016)
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
Available languages: Czech
Available design: Print design
from 16.80 USD more info
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