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IEC - International electro-technical commission
Page 1080
IEC/TS 63064-ed.1.0 (23/01/2018)
Graphical symbols for diagrams - Guidance on design for standardization in IEC 60617
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 2 489.50 CZK more info
IEC/TR 63065-ed.1.0 (15/09/2017)
Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 9 179.90 CZK more info
IEC/TR 63065-ed.1.0/Amd.1 (03/06/2022) Change
Amendment 1 - Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 622.40 CZK more info
IEC/TR 63065-ed.1.1+Amd.1-CSV (03/06/2022)
Guidelines for operation and maintenance of line commutated converter (LCC) HVDC converter station
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 16 959.50 CZK more info
IEC 63066-ed.1.0 (10/07/2026)
Low-voltage docking connectors for removable energy storage units
(Connecteurs de raccordement a basse tension pour unites de stockage d´energie amovibles)
Available languages: English, French, English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 11 825.00 CZK more info
IEC 63067-ed.1.0 (24/06/2020)
Electrical installations for lighting and beaconing of aerodromes - Connecting devices - General requirements and tests
(Installations electriques pour l´eclairage et le balisage des aerodromes - Dispositifs de connexion - Exigences generales et essais)
Available languages: Spanish, English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 4 978.90 CZK more info
IEC 63068-1-ed.1.0 (30/01/2019)
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 4 978.90 CZK more info
IEC 63068-2-ed.1.0 (30/01/2019)
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 4 978.90 CZK more info
IEC 63068-3-ed.1.0 (13/07/2020)
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence
(Dispositifs a semiconducteurs - Criteres de reconnaissance non destructifs des defauts au sein d’une plaquette homoepitaxiale de carbure de silicium pour des dispositifs d’alimentation - Partie 3 : Methode d’essai pour les defauts a l’aide de la photoluminescence)
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 6 534.90 CZK more info
IEC 63068-4-ed.1.0 (27/07/2022)
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 4 978.90 CZK more info
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