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IEC - International electro-technical commission
Page 390
IEC 60749-15-ed.3.0 (14/07/2020)
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 15: Resistance a la temperature de brasage pour dispositifs par trous traversants)
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 52.50 EUR more info
IEC 60749-15-ed.3.0-RLV (14/07/2020)
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 89.20 EUR more info
IEC 60749-16-ed.1.0 (17/01/2003)
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 16: Detection de bruit d´impact de particules (PIND))
Available languages: Spanish, English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 26.20 EUR more info
IEC 60749-17-ed.2.0 (28/03/2019)
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 17: Irradiation aux neutrons)
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 52.50 EUR more info
IEC 60749-18-ed.2.0 (10/04/2019)
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 18: Rayonnements ionisants (dose totale))
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 209.90 EUR more info
IEC 60749-18-ed.2.0-RLV (10/04/2019)
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Available languages: English
Available design: electronic design (pdf), Print design, CD-ROM
from 356.90 EUR more info
IEC 60749-19-ed.1.0 (13/02/2003)
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 19: Resistance de la pastille au cisaillement)
Available languages: Spanish, English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 26.20 EUR more info
IEC 60749-19-ed.1.0/Amd.1 (28/07/2010) Change
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
(Amendement 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 19: Resistance de la pastille au cisaillement)
Available languages: Spanish, English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 13.10 EUR more info
IEC 60749-19-ed.1.1+Amd.1-CSV (29/11/2010)
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 19: Resistance de la pastille au cisaillement)
Available languages: English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 65.60 EUR more info
IEC 60749-2-ed.1.0 (12/04/2002)
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 2: Basse pression atmospherique)
Available languages: Spanish, English and French
Available design: electronic design (pdf), Print design, CD-ROM
from 26.20 EUR more info
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