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IEC 60748-5-ed.1.0 (30.5.1997)

IEC 60748-5-ed.1.0 (30/05/1997)

Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 5: Circuits integres semi-personnalises)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 209.90 EUR more info
IEC 60749-1-ed.1.0 (30.8.2002)

IEC 60749-1-ed.1.0 (30/08/2002)

Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

Available languages: Spanish, English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 26.20 EUR more info
IEC 60749-1-ed.1.0/Cor.1 (12.8.2003)

IEC 60749-1-ed.1.0/Cor.1 (12/08/2003) Correction

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 1.30 EUR more info
IEC 60749-10-ed.2.0 (27.4.2022)

IEC 60749-10-ed.2.0 (27/04/2022)

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
(Dispositifs a semiconducteurs - Methodes d’essais mecaniques et climatiques - Partie 10: Chocs mecaniques - Dispositif et sous-ensemble)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 105.00 EUR more info
IEC 60749-11-ed.1.0 (12.4.2002)

IEC 60749-11-ed.1.0 (12/04/2002)

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Available languages: Spanish, English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 26.20 EUR more info
IEC 60749-11-ed.1.0/Cor.1 (30.1.2003)

IEC 60749-11-ed.1.0/Cor.1 (30/01/2003) Correction

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 1.30 EUR more info
IEC 60749-11-ed.1.0/Cor.2 (13.8.2003)

IEC 60749-11-ed.1.0/Cor.2 (13/08/2003) Correction

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 2 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 1.30 EUR more info
IEC 60749-12-ed.2.0 (13.12.2017)

IEC 60749-12-ed.2.0 (13/12/2017)

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 12: Vibrations, frequences variables)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 26.20 EUR more info
IEC 60749-13-ed.2.0 (15.2.2018)

IEC 60749-13-ed.2.0 (15/02/2018)

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
(Dispositifs a seminconducteurs - Methodes d´essais mecaniques et climatiques - Partie 13: Atmosphere saline)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 105.00 EUR more info
IEC 60749-14-ed.1.0 (7.8.2003)

IEC 60749-14-ed.1.0 (07/08/2003)

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 14: Robustesse des sorties (integrite des connexions))

Available languages: Spanish, English and French

Available design: electronic design (pdf), Print design, CD-ROM

from 105.00 EUR more info
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