IEC - International electro-technical commission

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 4: Circuits integres d´interface)

Available languages: English and French

Available design: electronic design (pdf), CD-ROM

Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
(Dispositifs a semiconducteurs - Circuits integres - Partie 5: Circuits integres semi-personnalises)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

Available languages: Spanish, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 1: Generalites)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
(Dispositifs a semiconducteurs - Methodes d’essais mecaniques et climatiques - Partie 10: Chocs mecaniques - Dispositif et sous-ensemble)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Available languages: Spanish, English and French

Available design: electronic design (pdf), Print design, CD-ROM

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 1 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
(Corrigendum 2 - Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 11: Variations rapides de temperature - Methode des deux bains)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
(Dispositifs a semiconducteurs - Methodes d´essais mecaniques et climatiques - Partie 12: Vibrations, frequences variables)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
(Dispositifs a seminconducteurs - Methodes d´essais mecaniques et climatiques - Partie 13: Atmosphere saline)

Available languages: English and French

Available design: electronic design (pdf), Print design, CD-ROM