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IEEE - Advanced technology for mankind
Page 285
IEEE 1668-2014 (22/09/2014) Withdrawn
IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V
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IEEE 167-1966 (29/06/1966) Withdrawn
IEEE Test Procedure for Facsimile
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IEEE 1671-2006 (15/12/2006) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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IEEE 1671-2010 (20/01/2011) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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IEEE 1671.1-2009 (11/12/2009) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
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IEEE 1671.2-2008 (17/12/2008) Withdrawn
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
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IEEE 1671.2-2012 (15/02/2013) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
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IEEE 1671.3-2007 (28/03/2008) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
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IEEE 1671.4-2007 (30/04/2008) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
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IEEE 1671.5-2008 (01/02/2012) Withdrawn
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
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