JIS - Japanese technical standards

Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry

Available languages: Japanese

Available design: electronic design (pdf), Print design

Non-dispersive infrared gas analyzer

Available languages: English, Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis-Secondary ion mass spectrometry-Linearity of intensity scale in single ion counting time-of-flight mass analysers

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Available languages: Japanese

Available design: electronic design (pdf), Print design