JIS - Japanese technical standards

Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis-Scanning probe microscopy-Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

Available languages: Japanese

Available design: electronic design (pdf), Print design

Surface chemical analysis-Handling of specimens prior to analysis

Available languages: Japanese

Available design: electronic design (pdf), Print design

Microbeam analysis -- Electron probe microanalysis -- Determination of experimental parameters for wavelength dispersive X-ray spectroscopy

Available languages: Japanese

Available design: electronic design (pdf), Print design

Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Available languages: Japanese

Available design: electronic design (pdf), Print design

Guideline for alignment procedure for identical location analysis between different microscopic measuring instruments

Available languages: Japanese

Available design: electronic design (pdf), Print design

Common format for measurement and analysis data

Available languages: Japanese

Available design: electronic design (pdf), Print design

Technical terms for analytical chemistry (General part)

Available languages: Japanese

Available design: electronic design (pdf), Print design

Technical terms for analytical chemistry (optical part)

Available languages: Japanese

Available design: electronic design (pdf), Print design