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STN - Slovak standards
Page 2976
STN 358767 (01/08/1982) Withdrawn
Semiconductor diodes. Methods of electrical parameters measurement
Available design: Print design
STN 358767-1 (01/11/1984) Withdrawn
Semiconductor mixing diodes for ultrahigh frequency. Methods of measuring noise ratio and standardized noise figure
Available design: Print design
STN 358768 (01/04/1983) Withdrawn
Semiconductor switching diodes. Electric parameters measurement methods
Available design: Print design
STN 358769 (01/04/1983) Withdrawn
Semiconductor Zener diodes. Electric parameters measurement methods
Available design: Print design
STN 358773 (01/02/1977) Withdrawn
Measurement of semiconductor devices. Thyristors. Measurement of blocking current and reverse blocking current
Available design: Print design
STN 358775 (01/10/1987) Withdrawn
Light-emitting diodes. Noise measurement in forward direction
Available design: Print design
STN EN 62415 (01/10/2010)
Polovodičové súčiastky. Skúška elektromigrácie pri konštantnom prúde (Norma na priame používanie ako STN).
Available languages: English
Available design: Print design
STN EN 62416 (01/10/2010)
Polovodičové súčiastky. Skúška horúcich nosičov u tranzistorov MOS (Norma na priame používanie ako STN).
Available languages: English
Available design: Print design
STN EN 62417 (01/10/2010)
Polovodičové súčiastky. Skúška pohyblivých iónov v poľom riadených tranzistoroch s hradlom izolovaným oxidom kovu (MOSFET) (Norma na priame používanie ako STN).
Available languages: English
Available design: Print design
STN EN IEC 63287-1 (01/01/2022)
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Available languages: English
Available design: Print design
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