STN - Slovak standards

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Available languages: English

Available design: Print design

Mixing and detection semiconductor UHF diodes. Electric parameter measurement methods

Available design: Print design

Polovodičové súčiastky. Skúšky kvality pokovovania (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

Usmernenia na metódu merania nelinearity zariadení s povrchovou akustickou vlnou (SAW) a objemovou akustickou vlnou (BAW) pri rádiových frekvenciách (RF) (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications

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Available design: Print design

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

Available languages: English

Available design: Print design

Vysokofrekvenčné (vf) filtre s objemovou akustickou vlnou (BAW) stanovenej kvality. Časť 2: Návod na používanie (Norma na priame používanie ako STN).

Available languages: English

Available design: Print design

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

Available languages: English

Available design: Print design

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

Available languages: English

Available design: Print design

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

Available design: Print design