Withdrawn | Published: 10/09/1997

ASTM E1127-91(1997) Withdrawn

Standard Guide for Depth Profiling in Auger Electron Spectroscopy

Available languages: English

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Detail information

Designation: ASTM E1127-91(1997)

Publication date: 10/09/1997

Pages: 4

Note: Withdrawn

Country: American technical standard

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Keywords:
Angle lapping, Argon atmospheres, Ball cratering, Crater edge profiling, Depth profiling, Gases, Ion sputtering, Noble gas ions, Nondestructive evaluation (NDE), Polishing properties, Spectroscopy-auger electron (AES), Sputter depth profiling data, Surface analysis-spectrochemical analysis, Xenon, ICS Number Code 71.040.50 (Physicochemical methods of analysis)

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