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Active standard | Published: 01/12/2020
ASTM E2382-04(2020)
Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Available languages: English
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Detail information
Designation: ASTM E2382-04(2020)
Publication date: 01/12/2020
Pages: 20
Country: American technical standard
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You can buy at www.mystandards.bizAnotation
Keywords:Abbe offset error, creep, dilation, hysteresis, nonlinearity, probe-sample mixing, AFM, STM, tip shape, proximal probe, geometric mixing, image reconstruction,, ICS Number Code 17.040.20 (Properties of surfaces)
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