Withdrawn | Published: 15/10/2011

ASTM E2444-11e1 Withdrawn

Terminology Relating to Measurements Taken on Thin, Reflecting Films (Includes all amendments And changes 5/28/2018).

Available languages: English

Available design: Online Secure PDF

from 68.70 EUR show on eshop

Detail information

Designation: ASTM E2444-11e1

Publication date: 15/10/2011

Pages: 2

Note: Withdrawn

Country: American technical standard

Where to buy?

You can buy at www.mystandards.biz

Anotation

Keywords:
cantilevers, definitions, fixed-fixed beams, interferometry, length measurements, microelectromechanical systems, MEMS, polysilicon, residual strain, stiction, strain gradient, terminology, test structure, ICS Number Code 01.040.31 (Electronics (Vocabularies)), 31.240 (Mechanical structures for electronic equipment)

Popular Publishers

full catalog