Withdrawn | Published: 10/06/1996

ASTM F1259M-96(2003) Withdrawn

Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)

Available languages: English

Available design: Online Secure PDF

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Detail information

Designation: ASTM F1259M-96(2003)

Publication date: 10/06/1996

Pages: 2

Note: Withdrawn

Country: American technical standard

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Keywords:
design guideline, electromigration, electromigration failure, interconnect metallization, metallization open-circuit, metallization resistance, microelectronic, test structure

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