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Withdrawn | Published: 10/06/1996
ASTM F1260M-96(2003) Withdrawn
Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)
Available languages: English
Available design: Online Secure PDF
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Detail information
Designation: ASTM F1260M-96(2003)
Publication date: 10/06/1996
Pages: 8
Note: Withdrawn
Country: American technical standard
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Keywords:electromigration, electromigration metallization, integrated circuit, microelectronics, open circuit, resistance increase, time-to-failure
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