ASTM F1262M-95(2008) Neplatná

Podrobné informace

Označení: ASTM F1262M-95(2008)

Datum vydání: 15.06.2008

Stran: 5

Poznámka: Neplatná

Země: Americká technická norma

Kde koupit?

Můžete zakoupit na eshop.normservis.cz

Anotace

Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, Combinational logic, Destructive testing--semiconductors, Digital integrated circuits, Electrical conductors (semiconductors), Failure end point--electronic components/devices, 0Functional errors, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, 0Microelectronic devices, MSI integrated circuits, Output transient voltage