ASTM F1262M-95(2008) Neplatné

Podrobné informácie

Označenie: ASTM F1262M-95(2008)

Dátum vydania: 15.06.2008

Stránok: 5

Poznámka: Neplatné

Krajina: Americká technická norma

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Môžete zakúpiť na eshop.normservis.sk

Anotácia

Keywords:
digital integrated circuits, digital IC´s, functional errors, ionizing, pulsed radiation, radiation, transient radiation, upset threshold, Combinational logic, Destructive testing--semiconductors, Digital integrated circuits, Electrical conductors (semiconductors), Failure end point--electronic components/devices, 0Functional errors, Integrated circuits, Ionizing radiation, Irradiance/irradiation--semiconductors, 0Microelectronic devices, MSI integrated circuits, Output transient voltage