Cookies
Potřebujeme Váš souhlas k využití jednotlivých dat, aby se Vám mimo jiné mohli ukazovat informace týkající se Vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Active standard | Published: 01/06/2026
ASTM F1892-26
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Available languages: English
Available design: Online Secure PDF, Standard + Redline - Online secure PDF, Print design, Print + redline
from 2 402.60 CZK
show on eshop
Detail information
Designation: ASTM F1892-26
Publication date: 01/06/2026
Pages: 42
Country: American technical standard
Where to buy?
You can buy at www.mystandards.bizAnotation
Keywords:ASIC (application specific integrated circuit), bipolar, cobalt 60 testing, ELDRS (enhanced low dose rate sensitivity), gamma ray tests, ionizing radiation testing, MOS, radiation hardness, semiconductor devices, time dependent effects, total dose testing, X-ray testing,, ICS Number Code 31.080.01 (Semi-conductor devices in general)
Popular Publishers
DIN standards
BS standards
ASTM standards
ISO standards
IEC standards
Copyright © All rights reserved | This template is made with by Colorlib
